以单相Boost型功率解耦光伏并网逆变器为研究对象,提出一种基于任务剖面的光伏并网逆变器的寿命预测方法。首先将安装点1年的太阳辐照度和环境温度作为任务剖面,通过PLECS热模型仿真获得不同工况下IGBT的结温数据;然后利用插值查表法得到安装点年任务剖面下对应的IGBT结温剖面,并根据结温循环寿命模型预测单个IGBT的寿命;最后通过蒙特卡罗法计算IGBT的寿命分布函数,并利用串联系统可靠性评估框图得到逆变器系统的寿命分布。计算结果表明逆变器的寿命分布在5年以上,满足ISO 9001质量管理体系认证。
Abstract
A method based on mission profile is proposed for predicting the lifetime of the single-phase Boost power decoupling photovoltaic grid-connected inverter. Firstly, the annual solar irradiance and ambient temperature of the installation site are taken as the mission profile, and the junction temperature data of IGBT under different operation conditions are obtained through thermal model simulation by PLECS. Then, the corresponding IGBT junction temperature profile under a yearly mission profile of the installation point is simulated by using the interpolation look-up table method. The lifetime of a single IGBT is predicted by the junction temperature cycle lifetime model. Finally, the distribution function of IGBT’s lifetime is calculated through Monte Carlo method, and the lifetime distribution of the inverter system is predicted by the reliability evaluation block diagram of the series system. The simulation results show that the lifetime distribution of the inverter is no less than 5 years, which meets the ISO9001 quality management system certification.
关键词
寿命预测 /
可靠性评估 /
蒙特卡罗法 /
光伏逆变器 /
任务剖面 /
功率解耦
Key words
lifetime prediction /
reliability evaluation /
Monte Carlo method /
photovoltaic inverter /
mission profile /
power decoupling
{{custom_sec.title}}
{{custom_sec.title}}
{{custom_sec.content}}
参考文献
[1] 国家能源局. 户用光伏项目信息[EB/OL].http://www.nea.gov.cn/2021-12/17/c_1310378968.htm.
National Energy Administration.Household PV project information[EB/OL]. http://www.nea.gov.cn/2021-12/17/c_1310378968.htm.
[2] PETRONE G, SPAGNUOIO G, TEODORESCU R, et al.Reliability issues in photovoltaic power processing systems[J]. IEEE transactions on industrial electronics, 2008, 55(7): 2569-2580.
[3] MOORE L, POST H.Five years of operating experience at a large, utility-scale photovoltaic generating plant[J]. Progress in photovoltaics: research and applications, 2008, 16(3): 249-259.
[4] BLAABJERG F, YANG Y, MA K.Power electronics key technology for renewable energy systems status and future[C]// International Conference on Electric Power and Energy Conversion Systems, Istanbul,Turkey, 2013.
[5] HARMS J W.Revision of MIL-HDBK-217, Reliability prediction of electronic equipment[C]// Proceedings-Annual Reliability and Maintainability Symposium(RAMS), San Jose, CA, USA, 2010.
[6] MOROZUMI A, YAMADA K, MIYASAKA T, et al.Reliability of power cycling for IGBT power semiconductor modules[J]. IEEE transactions on industry applications, 2003, 39(3): 665-671.
[7] YANG L, AGYAKWA P A, JOHNSON M C.Physics of failure lifetime prediction models for wire bond interconnects in power electronic modules[J]. IEEE transactions on device and materials reliability, 2013, 13(1): 9-17.
[8] YANG Y, WANG H, BLAABJERG F, et al.Mission profile based multi-disciplinary analysis of power modules in single-phase transformerless photovoltaic inverters[C]//15th European Conference on Power Electronics and Applications(EPE), Lille, France, 2013.
[9] SINTAMAREAN N, BLAABJERG F, WANG H,et al.Reliability oriented design tool for the new generation of grid connected PV inverters[J]. IEEE transactions on power electronics, 2015, 30(5): 2635-2644.
[10] XU S, MAO M Q, SHAO R M, et al.Voltage-reference active power decoupling based on boost converter for single-phase bridge inverter[C]//2018 International Power Electronics Conference, Niigata, Japan, 2018.
[11] YANG S Y, XIANG D W, BRYANT A T, et al.Condition monitoring for device reliability in power electronic converters: A review[J]. IEEE transactions on power electronics, 2010, 25(11): 2734-2752.
[12] BAYERER R, HERRMANN T, LICHT T, et al.Model for power cycling lifetime of IGBT modules-various factors influencing lifetime[C]// 5th International Conference on Integrated Power Electronics Systems, Nuremberg, Germany, 2008.
[13] HUANG H, MAWBY P A.A lifetime estimation technique for voltage source inverters[J]. IEEE transactions on power electronics, 2013, 28(8): 4113-4119.
[14] ASTM E1049-85(2017), Standard practices for cycle counting in fatigue analysis[S].
[15] REIGOSA P D, WANG H, YANG Y, et al.Prediction of bond wire fatigue of IGBTs in a PV inverter under a long-term operation[J]. IEEE transactions on power electronics, 2016, 31(10): 7171-7182.
[16] INFINEON. AN2019-05 PC and TC Diagrams[M/OL]. https://www.infineon.com/dgdl/Infineon-AN2019-05_PC_ and_TC_Diagrams-AN-v01_00-EN.pdf?fileId=5546d 46269e1c019016a594443e4396b.
基金
国家自然科学基金（51677050）; 高等学校学科创新引智计划（BP0719039）
PDF(9677 KB)
