晶体硅光伏组件存在多种光/电衰减机制,为了研究不同衰减条件的影响,该文首先对不同条件的衰减机理进行探讨;然后进行不同类型的衰减试验,并对试验结果进行分析。通过试验发现,所有类型的太阳电池均有光致或电致衰减现象;相较于PERC太阳电池,TOPCon太阳电池的光致及电致衰减速率较慢,同时在光致衰减（LID）试验中稳定周期最长;在LID试验后,所有类型太阳电池均会发生高温光致衰减。分析电致衰减（CID）与高温光致衰减（LeTID）试验衰减数据,发现组件功率衰减与填充因子变化呈正相关。
Abstract
There are various light/current-induced degradation mechanisms for crystalline silicon photovoltaic modules. In order to study the effects of different degradation conditions on degradation mechanisms, different degradation tests were carried out in this article. The test results were analyzed. It is found that all types of modules have light/current-induced degradation. Compared with PERC solar cell, TOPCon module has slower degradation rate and has longest stable period in LID experiment. After LID test, all types of modules still occur high temperature degradation. By analyzing the degradation data of CID and LeTID tests, it is found that the power degradation is positively correlated with the change of fill factors. This study is helpful to further understand the degradtion mechanism of photovoltaic modules and provides reference for the formulation of laboratory testing methods.
关键词
光伏组件 /
光/电致衰减 /
载流子注入 /
高温 /
可靠性
Key words
PV modules /
light/current-induced degradation /
carrier injection /
high temperature /
reliability
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基金
浙江省领军型创新创业团队项目（2019R01012）
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