晶体硅异质结光伏组件湿热衰减模型及寿命预测

任佳文, 罗云仁, 石建华, 刘文柱, 刘正新, 孟凡英

太阳能学报 ›› 2025, Vol. 46 ›› Issue (8) : 278-284.

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太阳能学报 ›› 2025, Vol. 46 ›› Issue (8) : 278-284. DOI: 10.19912/j.0254-0096.tynxb.2024-0498

晶体硅异质结光伏组件湿热衰减模型及寿命预测

  • 任佳文1,2, 罗云仁1,2, 石建华1, 刘文柱1~3, 刘正新1~3, 孟凡英1~3
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DAPM-HEAT ATTENUATION MODEL AND LIFETIME PREDICATION OF CRYSTALLINE SILICON HETEROJUNCTION PHOTOVOLTAIC MODULES

  • Ren Jiawen1,2, Luo Yunren1,2, Shi Jianhua1, Liu Wenzhu1-3, Liu Zhengxin1-3, Meng Fanying1-3
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摘要

以异质结组件为研究对象,进行多种湿热条件下的加速老化试验,基于老化试验数据,采用可靠性领域的Peck模型分析组件功率衰减过程,然后使用Wiener过程结合Peck模型进行组件寿命概率密度函数的计算,得到异质结组件在双85试验条件下的运行时间平均值。对概率密度函数进行积分得到可靠度函数,描述异质结组件在该试验条件下的失效分布特征。最后,利用得到的Peck-Wiener模型参数,建立任意温湿度下的组件寿命预测模型。通过寿命预测模型发现,在温湿度较低的大庆,组件的预测寿命为33 a;而在相对相对湿度超过80%的海南,组件的预测寿命大大降低。同时,将(50 ℃/45% RH)时的预测结果与实际环境数据集进行对比,验证本文所建立的Peck-Wiener模型的有效性与高精度。

Abstract

Using heterojunction with intrinsic thin-layer (HJT) modules as the research object, the accelerated aging test under various damp-heat (DH) conditions is carried out. Based on the aging test data, the Peck model was used to describe the power degradation process, and then combining the wiener process and the Peck model, calculating the lifetime probability density function to obtain the mean values of the operation time under the double 85 experimental conditions. The reliability function is derived by integrating the probability density function, which describes the failure distribution characteristics of the HJT modules. Finally, the parameters of Peck-Wiener model are used to establish the module lifetime prediction under arbitrary temperature and humidity, which reveals that the predicted lifetime of the module is 33 years in Daqing, where the temperature and humidity are low. And the lifetime is greatly reduced in Hainan, where the relative humidity exceeds 80%. Meanwhile, the prediction results at 50 ℃/45% RH are compared with the actual environmental dataset, which verifies the effectiveness and high accuracy of the Peck-Wiener model developed in this thesis.

关键词

晶体硅异质结组件 / 加速湿热试验 / Peck模型 / Wiener过程 / 寿命预测

Key words

HJT module / accelerated damp heat experiment / Peck model / Wiener process / lifetime prediction

引用本文

导出引用
任佳文, 罗云仁, 石建华, 刘文柱, 刘正新, 孟凡英. 晶体硅异质结光伏组件湿热衰减模型及寿命预测[J]. 太阳能学报. 2025, 46(8): 278-284 https://doi.org/10.19912/j.0254-0096.tynxb.2024-0498
Ren Jiawen, Luo Yunren, Shi Jianhua, Liu Wenzhu, Liu Zhengxin, Meng Fanying. DAPM-HEAT ATTENUATION MODEL AND LIFETIME PREDICATION OF CRYSTALLINE SILICON HETEROJUNCTION PHOTOVOLTAIC MODULES[J]. Acta Energiae Solaris Sinica. 2025, 46(8): 278-284 https://doi.org/10.19912/j.0254-0096.tynxb.2024-0498
中图分类号: TM615   

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基金

中国国防科技重点实验室基金(6142804220104; 61428040202)

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