基于栅极电流的多芯片IGBT模块芯片支路失效监测方法
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MONITORING METHOD FOR BRANCH FAILURE OF MULTI-CHIP IGBT MODULES BASED ON GATE CURRENT
Du Mingxing, Qiao Haotian, Yang Jianxiong, Yin Jinliang
太阳能学报
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2026, (4): 190
-200
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DOI: 10.19912/j.0254-0096.tynxb.2025-0968
