STUDY ON CAUSES AND IMPROVEMENT METHODS OF INTERMEDIATE DEFECTS IN PERC CELLS DETECTED BY EL

Xia Zhonggao; Peng Ping; Jing Yanjiao; Chen Lei; Wang Wenjing; Zhou Chunlan

doi:10.19912/j.0254-0096.tynxb.2022-0069

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Acta Energiae Solaris Sinica ›› 2023, Vol. 44 ›› Issue (6) : 198-203. DOI: 10.19912/j.0254-0096.tynxb.2022-0069

STUDY ON CAUSES AND IMPROVEMENT METHODS OF INTERMEDIATE DEFECTS IN PERC CELLS DETECTED BY EL

Xia Zhonggao¹, Peng Ping¹, Jing Yanjiao¹, Chen Lei¹, Wang Wenjing², Zhou Chunlan²

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Abstract

Electroluminescence （EL） inspection is a common defect detection method in PERC solar cell production, in which degradation of defect located in the middle of the cell accounts for more than 50% of total undesirable degradation detected by EL and has become a major obstacle for major PV manufacturing companies to break 99% of EL inspection yields. In order to find the causes of defects and improve this problem, improve the quality of solar cells and reduce cell manufacturing costs, this paper analyses and investigates the causes of defects that occur in the middle of the cell under EL inspection. Using quantum efficiency test and elemental analysis to rule out the possibility of defects caused by wafer quality and impurity contamination, combined with electrochemical capacitance-voltage（ECV） and scanning electron microscopy（SEM） tests, it is determined that the defects in the intermediate position of PERC cells are caused by a too high concentration of impurities on the surface of the diffusion process. Effective solutions are proposed to address the causes of defects, which can help to improve the quality of solar cells and increase the yield of cell EL inspection.

Key words

PERC cell / defect / surface doping concentration / EL / surface morphology of texture

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Xia Zhonggao, Peng Ping, Jing Yanjiao, Chen Lei, Wang Wenjing, Zhou Chunlan. STUDY ON CAUSES AND IMPROVEMENT METHODS OF INTERMEDIATE DEFECTS IN PERC CELLS DETECTED BY EL[J]. Acta Energiae Solaris Sinica. 2023, 44(6): 198-203 https://doi.org/10.19912/j.0254-0096.tynxb.2022-0069

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