LIGHT/CURRENT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES UNDER DIFFERENT TEMPERATURES

Zhu Bingjie; Song Hao; Chen Haomin; Huai Chaojun; Hu Dan; He Yifeng

doi:10.19912/j.0254-0096.tynxb.2022-0111

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Acta Energiae Solaris Sinica ›› 2023, Vol. 44 ›› Issue (6) : 227-233. DOI: 10.19912/j.0254-0096.tynxb.2022-0111

LIGHT/CURRENT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES UNDER DIFFERENT TEMPERATURES

Zhu Bingjie¹, Song Hao¹, Chen Haomin¹, Huai Chaojun¹, Hu Dan¹, He Yifeng²

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Abstract

There are various light/current-induced degradation mechanisms for crystalline silicon photovoltaic modules. In order to study the effects of different degradation conditions on degradation mechanisms, different degradation tests were carried out in this article. The test results were analyzed. It is found that all types of modules have light/current-induced degradation. Compared with PERC solar cell, TOPCon module has slower degradation rate and has longest stable period in LID experiment. After LID test, all types of modules still occur high temperature degradation. By analyzing the degradation data of CID and LeTID tests, it is found that the power degradation is positively correlated with the change of fill factors. This study is helpful to further understand the degradtion mechanism of photovoltaic modules and provides reference for the formulation of laboratory testing methods.

Key words

PV modules / light/current-induced degradation / carrier injection / high temperature / reliability

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Zhu Bingjie, Song Hao, Chen Haomin, Huai Chaojun, Hu Dan, He Yifeng. LIGHT/CURRENT-INDUCED DEGRADATION OF CRYSTALLINE SILICON PHOTOVOLTAIC MODULES UNDER DIFFERENT TEMPERATURES[J]. Acta Energiae Solaris Sinica. 2023, 44(6): 227-233 https://doi.org/10.19912/j.0254-0096.tynxb.2022-0111

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