STUDY ON RELIABILITY TEST OF THIN-FILM PHOTOVOLTAIC MODULE

Tao Haiquan; Fang Zhenlei; Sun Yong; Tian Wei

doi:10.19912/j.0254-0096.tynxb.2023-1582

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Acta Energiae Solaris Sinica ›› 2025, Vol. 46 ›› Issue (2) : 410-415. DOI: 10.19912/j.0254-0096.tynxb.2023-1582

STUDY ON RELIABILITY TEST OF THIN-FILM PHOTOVOLTAIC MODULE

Tao Haiquan¹, Fang Zhenlei¹, Sun Yong², Tian Wei³

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Abstract

To ensure the high reliability of thin-film photovoltaic modules over the service life 25 years, based on the tightened test sequence of internationally renowned testing institutions and laboratories, and combined the photovoltaic module qualification test standards, safety test standards, existing reliability test sequences and environmental stress acceleration models, the reliability test sequence is proposed in this paper. The reliability test sequence includes 7 subsequences： thermal cycle, mechanical properties, comprehensive material properties, wet thermal resistance to water properties, PID resistance, outdoor exposure and comparison test, which is suitable for evaluating the environmental durability and material properties of thin-film photovoltaic modules in the life cycle.

Key words

thin-film solar cells / thin-film photovoltaic module / reliability / life cycle / test sequence / cumulative attenuation

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Tao Haiquan, Fang Zhenlei, Sun Yong, Tian Wei. STUDY ON RELIABILITY TEST OF THIN-FILM PHOTOVOLTAIC MODULE[J]. Acta Energiae Solaris Sinica. 2025, 46(2): 410-415 https://doi.org/10.19912/j.0254-0096.tynxb.2023-1582

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