FAULT DIAGNOSIS STRATEGY FOR MMC SUBMODULE OPEN-CIRCUIT FAULTS BASED ON ARM VOLTAGE VARIATION

Ma Wenzhong; Sun Yuanbo; Wang Yusheng; Zhang Wenyan; Li Hengshuo; Zhu Yaheng

doi:10.19912/j.0254-0096.tynxb.2024-1901

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Acta Energiae Solaris Sinica ›› 2026, Vol. 47 ›› Issue (3) : 72-79. DOI: 10.19912/j.0254-0096.tynxb.2024-1901

FAULT DIAGNOSIS STRATEGY FOR MMC SUBMODULE OPEN-CIRCUIT FAULTS BASED ON ARM VOLTAGE VARIATION

Ma Wenzhong¹, Sun Yuanbo¹, Wang Yusheng², Zhang Wenyan¹, Li Hengshuo¹, Zhu Yaheng¹

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Abstract

A sub-module（SM） open-circuit fault,as one of the common faults in Modular Multilevel Converters （MMC） affects the safe and stable operation of the system. To detect faulty SMs in a timely manner,this paper proposes an MMC open-circuit fault diagnosis strategy based on the variation of arm voltages variation. By using the abnormal arm voltage increment of the arm within two sampling periods, the faulty arm is identified. The average SM capacitor voltage within the faulty arm is then calculated and compared with each individual SM capacitor voltage. When the difference exceeds a set threshold,the faulty SM is located,and the average value is updated to continue detecting any remaining faulty SMs,this allows for the detection of both single and multiple SMs faults. Furthermore,a method for setting the threshold is provided based on theoretical analysis.This strategy features simple steps,fast detection speed,and low computational complexity, enabling the detection of both single and multiple SM faults. The feasibility and effectiveness of the proposed method have been validated through MATLAB/Simulink simulation analysis and hardware-in-the-loop （HIL） system experiments.

Key words

modular multi-level converters / fault detection / arm voltage / threshold voltage / sub-module / open-circuit fault / fault location

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Ma Wenzhong, Sun Yuanbo, Wang Yusheng, Zhang Wenyan, Li Hengshuo, Zhu Yaheng. FAULT DIAGNOSIS STRATEGY FOR MMC SUBMODULE OPEN-CIRCUIT FAULTS BASED ON ARM VOLTAGE VARIATION[J]. Acta Energiae Solaris Sinica. 2026, 47(3): 72-79 https://doi.org/10.19912/j.0254-0096.tynxb.2024-1901

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