MECHANISTIC INSIGHTS INTO MICROSTRUCTURE CHANGES OF EPOXY RESIN ON DC ELECTRICAL PROPERTIES UNDER LOW TEMPERATURE-STRESS COUPLING AGING

Zhang Yunxiao; Chi Zhengnan; Liu Yuhao; Lin Wenxin; Gao Yanfeng

doi:10.19912/j.0254-0096.tynxb.2024-1906

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Acta Energiae Solaris Sinica ›› 2026, Vol. 47 ›› Issue (3) : 80-88. DOI: 10.19912/j.0254-0096.tynxb.2024-1906

MECHANISTIC INSIGHTS INTO MICROSTRUCTURE CHANGES OF EPOXY RESIN ON DC ELECTRICAL PROPERTIES UNDER LOW TEMPERATURE-STRESS COUPLING AGING

Zhang Yunxiao¹, Chi Zhengnan¹, Liu Yuhao¹, Lin Wenxin¹, Gao Yanfeng²

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Abstract

In order to explore the aging characteristics of insulating materials under the combined action of low temperature-stress, in this paper, epoxy resin material is selected. The aging test of epoxy resin under different pressures （0-0.3 MPa） and low temperature （-30 ℃） was carried out, and the microscopic and electrical properties of epoxy resin in different aging stages were tested, and the influence mechanism of low temperature-stress combined effect on the electrical properties of epoxy resin was analyzed. The results show that under the same stress, with the increase of aging time, the cracks in the epoxy resin widen and deepen, and the number increases significantly. As the applied stress increases from 0 MPa to 0.3 MPa, the DC breakdown voltage decreases as a whole, the conductivity increases significantly, and the densities of deep and shallow traps increase. This is mainly caused by the formation of more microcracks under the combined action of low temperature and high stress. In particular, after 30 days of combined aging with low temperature and 0.3 MPa stress, the DC breakdown performance of epoxy resin decreased by 32.0%, and the DC conductivity increased by 16.3 times.

Key words

epoxy resin / high voltage cable accessories / microcracks / DC breakdown strength / electrical conductivity / low temperature-mechanical stress

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Zhang Yunxiao, Chi Zhengnan, Liu Yuhao, Lin Wenxin, Gao Yanfeng. MECHANISTIC INSIGHTS INTO MICROSTRUCTURE CHANGES OF EPOXY RESIN ON DC ELECTRICAL PROPERTIES UNDER LOW TEMPERATURE-STRESS COUPLING AGING[J]. Acta Energiae Solaris Sinica. 2026, 47(3): 80-88 https://doi.org/10.19912/j.0254-0096.tynxb.2024-1906

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