RESEARCH ON DH FAILURE MECHANISM OF SINGLE GLASS TOPCon MODULES

Wu Wei; Lyu Lin; Zhang Yan; Fu Chenggang; Chen Shanyong; Yang Weiguang

doi:10.19912/j.0254-0096.tynxb.2024-2052

PDF(4833 KB)

Acta Energiae Solaris Sinica ›› 2026, Vol. 47 ›› Issue (3) : 753-759. DOI: 10.19912/j.0254-0096.tynxb.2024-2052

RESEARCH ON DH FAILURE MECHANISM OF SINGLE GLASS TOPCon MODULES

Wu Wei, Lyu Lin, Zhang Yan, Fu Chenggang, Chen Shanyong, Yang Weiguang

Author information +

History +

Abstract

This investigation reveals three failure mechanisms of glass-backsheet tunnel oxide passivating contact （TOPCon） modules under damp heat conditions： 1） corrosion of the fine grid lines; 2） corrosion around the interconnected areas of the busbars and solder ribbons; and 3） failure of the solder ribbons, main busbars and cell interconnection regions. Damp heat failure is caused by electrochemical corrosion due to Ag-Al paste, moisture, acetic acid from solder fluxes and encapsulation materials （EPE/EVA）, and contaminants containing Na+ and Cl-, which leads to weakening of the interconnections within the component, and ultimately to failure. Through the comparative study of different welding solutions, the use of Integrated Film Covering welding technology can effectively block the penetration of corrosive media by virtue of the innovative encapsulation process, showing excellent resistance to damp heat, and providing the solution to enhance the damp-heat-resistant performance of the single-glass TOPCon modules.

Key words

tunnel oxide passivating contact / damp heat / failure modes / contact failure / electrochemical corrosion / integrated film covering welding technology

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

Wu Wei, Lyu Lin, Zhang Yan, Fu Chenggang, Chen Shanyong, Yang Weiguang. RESEARCH ON DH FAILURE MECHANISM OF SINGLE GLASS TOPCon MODULES[J]. Acta Energiae Solaris Sinica. 2026, 47(3): 753-759 https://doi.org/10.19912/j.0254-0096.tynxb.2024-2052

References

[1] 唐圣学, 宋晓, 李明, 等. 光伏组件寿命衰退建模与寿命预测高斯随机过程回归方法研究[J]. 太阳能学报, 2022, 43(12): 41-49.
TANG S X, SONG X, LI M, et al.Research on lifetime degradation modeling and Gaussian stochastic process regression method for life prediction of photovoltaic modules[J]. Acta energiae solaris sinica, 2022, 43(12): 41-49.
[2] PETERS I M, HAUCH J, BRABEC C, et al.The value of stability in photovoltaics[J]. Joule, 2021, 5(12): 3137-3153.
[3] 叶浩然, 何佳龙, 陈杨, 等. TOPCon太阳电池电子选择性接触研究[J]. 太阳能学报, 2024, 45(2): 475-479.
YE H R, HE J L, CHEN Y, et al.Research on electron selective contact of TOPCon solar cells[J]. Acta energiae solaris sinica, 2024, 45(2): 475-479.
[4] 白宇, 何佳龙, 李君君, 等. 光电性能可调的TiN薄膜及在TOPCon太阳电池的应用[J]. 太阳能学报, 2023, 44(9): 72-77.
BAI Y, HE J L, LI J J, et al.TiN thin film with adjustable photoelectric performance and its application in TOPCon solar cell[J]. Acta energiae solaris sinica, 2023, 44(9): 72-77.
[5] 孟庆法, 田茜茜. 光伏组件PID失效与DH失效的微观分析研究[J]. 太阳能, 2021(2): 17-25.
MENG Q F, TIAN Q Q.Research on micro analysis of PID and DH failed PV modules[J]. Solar energy, 2021(2): 17-25.
[6] KARAS J, SINHA A, BUDDHA V S P, et al. Damp heat induced degradation of silicon heterojunction solar cells with Cu-plated contacts[J]. IEEE journal of photovoltaics, 2020, 10(1): 153-158.
[7] SEN C, WU X Y, WANG H R, et al.Accelerated damp-heat testing at the cell-level of bifacial silicon HJT, PERC and TOPCon solar cells using sodium chloride[J]. Solar energy materials and solar cells, 2023, 262: 112554.
[8] SEGBEFIA O K, AKHTAR N, SÆTRE T O. Moisture induced degradation in field-aged multicrystalline silicon photovoltaic modules[J]. Solar energy materials and solar cells, 2023, 258: 112407.
[9] OH W, KIM S, BAE S, et al.The degradation of multi-crystalline silicon solar cells after damp heat tests[J]. Microelectronics reliability, 2014, 54(9/10): 2176-2179.
[10] IQBAL N, LI M J, SAKTHIVEL T S, et al.Impact of acetic acid exposure on metal contact degradation of different crystalline silicon solar cell technologies[J]. Solar energy materials and solar cells, 2023, 250: 112089.
[11] MEI A Y, LI X, LIU L F, et al.A hole-conductor-free, fully printable mesoscopic perovskite solar cell with high stability[J]. Science, 2014, 345(6194): 295-298.
[12] IEC 61646, Thin-film terrestrial photovoltaic(PV) modules: design qualification and type approval[S].
[13] ZHOU Y F, CHEN D Y, Ye Y, et al.Damp-heat endurance investigation of PV modules based on n-type bifacial passivated contact cells[C]//40th European Photovoltaic Solar Energy Conference and Exhibition.European, 2023.
[14] SEN C, WANG H R, KHAN M U, et al.Buyer aware: three new failure modes in TOPCon modules absent from PERC technology[J]. Solar energy materials and solar cells, 2024, 272: 112877.
[15] LAUSCH D, NAUMANN V, BREITENSTEIN O, et al.Potential-induced degradation(PID): introduction of a novel test approach and explanation of increased depletion region recombination[J]. IEEE journal of photovoltaics, 2014, 4(3): 834-840.
[16] KHAN M U, SEN C, CHAN C, et al.Supercharging cell-level potential-induced degradation (PID) testing using a salt-enriched hybrid polymer layer[J]. Solar energy materials and solar cells, 2023, 260: 112479.
[17] FAYE I, NDIAYE A, GECKE R, et al.Experimental study of observed defects in mini-modules based on crystalline silicone solar cell under damp heat and thermal cycle testing[J]. Solar energy, 2019, 191: 161-166.
[18] SOMMELING P M, LIU J, KROON J M.Corrosion effects in bifacial crystalline silicon PV modules; interactions between metallization and encapsulation[J]. Solar energy materials and solar cells, 2023, 256: 112321.