三结太阳电池低频噪声特性与可靠性表征研究

余永涛; 王小强; 罗宏伟; 肖文杰; 孙宇; 罗军

doi:10.19912/j.0254-0096.tynxb.2020-0052

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太阳能学报 ›› 2022, Vol. 43 ›› Issue (2) : 163-168. DOI: 10.19912/j.0254-0096.tynxb.2020-0052

三结太阳电池低频噪声特性与可靠性表征研究

余永涛¹, 孙宇¹, 王小强¹, 罗宏伟¹, 罗军¹, 肖文杰²

作者信息 +

RESEARCH ON LOW-FREQUENCY NOISE AND RELABILITY CHARACTERIZATION OF TRIPLE-JUNCTION SOLAR CELLS

Yu Yongtao¹, Sun Yu¹, Wang Xiaoqiang¹, Luo Hongwei¹, Luo Jun¹, Xiao Wenjie²

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文章历史 +

摘要

以GaInP/InGaAs/Ge三结太阳电池为研究对象,通过宽范围电流偏置条件下的低频噪声测试和高温应力试验,对三结太阳电池的低频噪声特性和可靠性表征进行研究分析。结果表明,三结太阳电池的低频噪声包括1/f噪声和G-R噪声。在宽范围电流偏置条件下,低频噪声随偏置电流呈先增大后减小的规律,并在频率为500 Hz时出现G-R噪声特征。高温应力试验后,太阳电池在小电流偏置条件下的低频噪声明显增大,与器件暗I-V特性的变化一致,归因于热应力诱发的器件缺陷。相对于单频点噪声参数,宽频带噪声参数可更准确稳定地表征太阳电池可靠性。

Abstract

Low-frequency noise characteristic of GaInP/InGaAs/Ge triple-junction solar cells is studied through high temperature stress test and noise test under a wide range of bias current. Experimental results demonstrate that the noise types observed in triple-junction solar cells are 1/f noise and G-R noise. The noise firstly increases to the maximum value and then decreases with the bias current. The typical G-R noise is observed at 500 Hz. After high temperature stress test of triple-junction solar cells, the noise magnitude increases evidently at the lower bias current, which could be attributed to device defects induced by thermal stress. And the dark I-V characteristic of solar cells exhibits consistent performance. Compared with single frequency noise parameters, wideband noise is more sensitive and accurate in indicating solar cells reliability.

导出引用

余永涛, 孙宇, 王小强, 罗宏伟, 罗军, 肖文杰. 三结太阳电池低频噪声特性与可靠性表征研究[J]. 太阳能学报. 2022, 43(2): 163-168 https://doi.org/10.19912/j.0254-0096.tynxb.2020-0052

Yu Yongtao, Sun Yu, Wang Xiaoqiang, Luo Hongwei, Luo Jun, Xiao Wenjie. RESEARCH ON LOW-FREQUENCY NOISE AND RELABILITY CHARACTERIZATION OF TRIPLE-JUNCTION SOLAR CELLS[J]. Acta Energiae Solaris Sinica. 2022, 43(2): 163-168 https://doi.org/10.19912/j.0254-0096.tynxb.2020-0052

中图分类号： TM914.4

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